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Vermont Optechs, Inc. www.scopeshop.com Materials Science |
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Upright Metallurgical Microscopes
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| Leica |
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LMU02 - Leica DMLM for Incident Light Brightfield, Darkfield & Nomarski DIC
Leica DMLM for Incident Light Brightfield, Darkfield & Nomarski DIC |
| Olympus |
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OMU1 - Olympus BHSM Metallurgical Microscope for Incident & Transmitted Light
Olympus BHSM Metallurgical Microscope for Incident & Transmitted Light |
| Zeiss |
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ZMU05 - Zeiss Axiophot for film and digital imaging in Brightfield, Darkfield & Nomarski DIC
Zeiss Axiophot for film and digital imaging in Brightfield, Darkfield & Nomarski DIC |
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ZMU01 - Zeiss UEM Upright Metallurgical Microscope for Incident Light
This robust modular microscope can be configured for numerous industrial inspection tasks. The easily accessible mechanical stage accomodates large specimens. |
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ZMU02 - Zeiss Axioplan for Brightfield, Darkfield and Nomarski DIC
Discriminating materials scientists worldwide regard the range-topping Axioplan as one of the best. |
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ZMU03 - Zeiss Universal Microscope for Reflected Light Nomarski DIC
One of the all-time classics from Zeiss, the Universal for reflected light Nomarski DIC delivers some of the finest images available in the materials sciences. |
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ZMU04 - Zeiss 20T for Reflected Light Brightfield and Darkfield
Classic, routine shop scope by Zeiss is solidly built to withstand the rigors of the production environment. |
| Nikon |
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NMU01 - Nikon Optiphot M Trinocular Microscope for Reflected Light Brightfield, Darkfield and Nomarski DIC
Sharp Nikon BD Plan DIC objectives provide brilliant images of difficult subjects. |
| Leitz |
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LMU01 - Leitz Laborlux 12 HL for Reflected Light Nomarski DIC
The ergonomic design of the Leitz Laborlux 12 HL allows effortless observation and operation for the DIC investigation of opaque objects. |
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Inverted Metallographs
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| Nikon |
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NMI1 - Nikon Epiphot 200 Inverted Metallograph
Nikon Epiphot 200 Inverted Metallograph |
| Zeiss |
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ZMI01 - Zeiss ICM 405 with Epiplan-HD Objectives for Brightfield and Darkfield
For metallurgical applications demanding easy photo documentation, the ultra-stable Zeiss ICM 405 offers an elegant solution. ZMI01 offers built-in 4x5 / Polaroid and 35mm capability and brightfield-darkfield Epi-Planachromat objectives delivering ASTM standard magnifications to 1000X. |
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Infrared Microscopes
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| Spectra-Tech |
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IRU01 - Spectra-Tech IR-Plan Microscope for Transmitted and Reflected Light Microspectrometry and FTIR Sampling
This well-regarded microanalytical instrument allows sophisticated determination of unknown samples using spectrophotometric techniques. |
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Semiconductor Inspection Microscopes
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| Leitz |
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LSC02 - Leitz Ergolux for Nomarski DIC
High-contrast color images of difficult samples are easily obtained with this classic performer from Leitz of Germany. |
| Zeiss |
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ZSC01 - Zeiss Axiotron 6"x6" Wafer Inspection Microscope for Brightfield, Darkfield and Nomarski DIC
Pin-sharp images of extremely fine features are a hallmark of this superlative performer from world leader Zeiss. |
| Leitz |
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LSC01 - Leitz Ergolux with NPL Objectives for Brightfield and Darkfield
The classic Leitz Ergolux semiconductor inspection microscope offers 6 inch stage travel for routine quality control and other metallurgical applications requiring brightfield and darkfield. |
| Nikon |
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NSC02 - Nikon Optiphot 66 Trinocular Microscope for Brightfield & Darkfield
Recognized as an excellent performer by semiconductor producers worldwide, the Optiphot 66 represents a value benchmark in 150 mm. instruments. |
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NSC01 - Nikon Optiphot 200 8" x 8" Semiconductor Inspection Microscope
The embodiment of recent thinking in ergonomic 200 mm. semiconductor inspection microscopes, the Nikon Optiphot 200 offers numerous features that markedly enhance efficiency and comfort. |
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Specialty Metallurgical Microscopes
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| Nikon |
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NMS04 - Nikon Accessories for Interference Metallography
Nikon Accessories for Interference Metallography |
| Leitz |
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LMS02 - Leitz Forensic Bullet Comparison Macroscope
Long the world standard for forensic laboratory investigations of firearms, forgery and counterfeit evidence in law enforcement, the Leitz Comparison Macroscope endures as the precision performance leader. |
| Nikon |
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NMS01 - Nikon Ophtiphot for Mirau Interference Microscopy
The classic Nikon Optiphot microscope is offered here equipped to extract extremely subtle height and surface anomaly data from opaque incident light specimens using non-contact interference optics. |
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NMS02 - Nikon Optiphot 100 Modular Microscope for ELWD Brightfield & Darkfield on Heavy Boom Stand
By permitting long working distance high-magnification optics to approach large or difficult to access samples, this unique configuration allows great flexibility of placement while maintaining critical stability. |
| Zeiss |
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ZMS01 - Zeiss Light-Section Microscope
A fine surface-testing microscope which uses the light-section method to examine and measure surface topography simply, accurately and non-destructively. |
MATERIALS SCIENCE