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Materials Science

 
 


  Upright Metallurgical Microscopes
 

  Leica  

LMU02 - Leica DMLM for Incident Light Brightfield, Darkfield & Nomarski DIC

Leica DMLM for Incident Light Brightfield, Darkfield & Nomarski DIC


  Olympus  

OMU1 - Olympus BHSM Metallurgical Microscope for Incident & Transmitted Light

Olympus BHSM Metallurgical Microscope for Incident & Transmitted Light


  Zeiss  

ZMU05 - Zeiss Axiophot for film and digital imaging in Brightfield, Darkfield & Nomarski DIC

Zeiss Axiophot for film and digital imaging in Brightfield, Darkfield & Nomarski DIC


ZMU01 - Zeiss UEM Upright Metallurgical Microscope for Incident Light

This robust modular microscope can be configured for numerous industrial inspection tasks. The easily accessible mechanical stage accomodates large specimens.


ZMU02 - Zeiss Axioplan for Brightfield, Darkfield and Nomarski DIC

Discriminating materials scientists worldwide regard the range-topping Axioplan as one of the best.


ZMU03 - Zeiss Universal Microscope for Reflected Light Nomarski DIC

One of the all-time classics from Zeiss, the Universal for reflected light Nomarski DIC delivers some of the finest images available in the materials sciences.


ZMU04 - Zeiss 20T for Reflected Light Brightfield and Darkfield

Classic, routine shop scope by Zeiss is solidly built to withstand the rigors of the production environment.


  Nikon  

NMU01 - Nikon Optiphot M Trinocular Microscope for Reflected Light Brightfield, Darkfield and Nomarski DIC

Sharp Nikon BD Plan DIC objectives provide brilliant images of difficult subjects.


  Leitz  

LMU01 - Leitz Laborlux 12 HL for Reflected Light Nomarski DIC

The ergonomic design of the Leitz Laborlux 12 HL allows effortless observation and operation for the DIC investigation of opaque objects.


  Inverted Metallographs
 

  Nikon  

NMI1 - Nikon Epiphot 200 Inverted Metallograph

Nikon Epiphot 200 Inverted Metallograph


  Zeiss  

ZMI01 - Zeiss ICM 405 with Epiplan-HD Objectives for Brightfield and Darkfield

For metallurgical applications demanding easy photo documentation, the ultra-stable Zeiss ICM 405 offers an elegant solution. ZMI01 offers built-in 4x5 / Polaroid and 35mm capability and brightfield-darkfield Epi-Planachromat objectives delivering ASTM standard magnifications to 1000X.


  Infrared Microscopes
 

  Spectra-Tech  

IRU01 - Spectra-Tech IR-Plan Microscope for Transmitted and Reflected Light Microspectrometry and FTIR Sampling

This well-regarded microanalytical instrument allows sophisticated determination of unknown samples using spectrophotometric techniques.


  Semiconductor Inspection Microscopes
 

  Leitz  

LSC02 - Leitz Ergolux for Nomarski DIC

High-contrast color images of difficult samples are easily obtained with this classic performer from Leitz of Germany.


  Zeiss  

ZSC01 - Zeiss Axiotron 6"x6" Wafer Inspection Microscope for Brightfield, Darkfield and Nomarski DIC

Pin-sharp images of extremely fine features are a hallmark of this superlative performer from world leader Zeiss.


  Leitz  

LSC01 - Leitz Ergolux with NPL Objectives for Brightfield and Darkfield

The classic Leitz Ergolux semiconductor inspection microscope offers 6 inch stage travel for routine quality control and other metallurgical applications requiring brightfield and darkfield.


  Nikon  

NSC02 - Nikon Optiphot 66 Trinocular Microscope for Brightfield & Darkfield

Recognized as an excellent performer by semiconductor producers worldwide, the Optiphot 66 represents a value benchmark in 150 mm. instruments.


NSC01 - Nikon Optiphot 200 8" x 8" Semiconductor Inspection Microscope

The embodiment of recent thinking in ergonomic 200 mm. semiconductor inspection microscopes, the Nikon Optiphot 200 offers numerous features that markedly enhance efficiency and comfort.


  Specialty Metallurgical Microscopes
 

  Nikon  

NMS04 - Nikon Accessories for Interference Metallography

Nikon Accessories for Interference Metallography


  Leitz  

LMS02 - Leitz Forensic Bullet Comparison Macroscope

Long the world standard for forensic laboratory investigations of firearms, forgery and counterfeit evidence in law enforcement, the Leitz Comparison Macroscope endures as the precision performance leader.


  Nikon  

NMS01 - Nikon Ophtiphot for Mirau Interference Microscopy

The classic Nikon Optiphot microscope is offered here equipped to extract extremely subtle height and surface anomaly data from opaque incident light specimens using non-contact interference optics.


NMS02 - Nikon Optiphot 100 Modular Microscope for ELWD Brightfield & Darkfield on Heavy Boom Stand

By permitting long working distance high-magnification optics to approach large or difficult to access samples, this unique configuration allows great flexibility of placement while maintaining critical stability.


  Zeiss  

ZMS01 - Zeiss Light-Section Microscope

A fine surface-testing microscope which uses the light-section method to examine and measure surface topography simply, accurately and non-destructively.


 

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