Vermont Optechs, Inc.
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Nikon Optiphot 200 8" x 8" Semiconductor Inspection Microscope
(Ref # NSC01)

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NSC01
 
NSC01
 

NSC01 Specifications

  • Full Nomarski DIC capability at 200x and 500x for simplified defect management and quality control in the sub-micron range. Other magnifications optionally available.

  • Extra-Long Working Distance (ELWD) objective specification guarantees the safety of the critical lens front elements and the valuable samples under review.

  • The motorized polarizer and revolving objective nosepiece are controlled from a remote keypad, amply demonstrating Nikon's attention to concerns over wafer contamination.

  • Forward-positioned stage and focus controls complement this thinking.

  • User ergonomics further addressed with widefield tilting trinocular eyepiece tube.

  • Bright 12 v, 100 w halogen illuminator assures short time exposures and crisp video.



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